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Localization of Damaged Resources in NoC Based Shared-Memory MP2SOC, using a Distributed Cooperative Configuration Infrastructure
Zhang Z., Refauvelet D., Greiner A., Benabdenbi M., Pécheux F.
The 29th IEEE VLSI Test Symposium (VTS), Dana Point, California : États-Unis (2011) - http://hal.archives-ouvertes.fr/hal-00591807
Conférences invitées
Informatique/Architecture
Localization of Damaged Resources in NoC Based Shared-Memory MP2SOC, using a Distributed Cooperative Configuration Infrastructure
Zhen Zhang () 1, Dimitri Refauvelet 1, Alain Greiner 1, Mounir Benabdenbi 2, François Pécheux 1
1 :  Laboratoire d'Informatique de Paris 6 (LIP6)
http://www.lip6.fr/
CNRS : UMR7606 – Université Pierre et Marie Curie (UPMC) - Paris VI
4 Place JUSSIEU 75252 PARIS CEDEX 05
France
2 :  Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA)
http://tima.imag.fr/
CNRS : UMR5159 – Université Joseph Fourier - Grenoble I – Institut National Polytechnique de Grenoble (INPG)
46 Av Félix Viallet 38031 GRENOBLE CEDEX 1
France
In this paper, we present a software approach for localization of faulty components in a 2D-mesh Network-on-Chip, targeting fault tolerance in a shared memory MP2SoC architecture. We use a pre-existing and distributed hardware infrastructure supporting self-test and de-activation of the faulty components (routers and communication channels), that are transformed into ''black hole''. We detail the software method used to localize these ''black holes'', and centralize the information in a single point, where a modified global routing function can be defined. This embedded software makes an extensive use of a distributed fault-tolerant configuration firmware assisted by a Distributed Cooperative Configuration Infrastructure (DCCI), that is also presented. Finally, ''black hole'' detection and localization coverage is evaluated.
Anglais
05/2011

internationale

The 29th IEEE VLSI Test Symposium (VTS)
01/05/2011
05/05/2011
Dana Point, California
États-Unis

NoC Test – NoC Reconfiguration – Fault-tolerance – DCCI

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